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Elementanalyse
Sn-Layer
The thickness of the non-alloyed and alloyed tin layer on thin copper wires can be measured with high accuracy in a short duration by the electrochemical Analyzer. The coulometric determination of the thickness of the tin layer at the copper wires based on a newly developed procedure: the technique of voltammetry with a multiple potential-ramp. The total amount of tin as well as the non-alloyed and the alloyed tin-part is detectable in only one measurement.
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